X-Ray Photoelectron Spectroscopy

Description: The system has in-situ sample heating up to 800° C, sputter depth profile capabilities, monochromatic AlKa, a non-monochromatic dual anode with Mg Ka/Al Ka, and scanning Auger electron microscopy.

There is a site license for CasaXPS for data analysis, and the NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA). These are available to users of the system, and Igor can assist if there are any questions on how to use the software.

Usage

Igor will perform the measurements until further notice. The fees for analysis are listed below.

Fees (no assistance):

Research Associate time:

Acknowledgement: acknowledge support from NSF and OregonBEST if you publish results obtained from this XPS system. Use this text: “A portion of this research was performed at the Northwest Nanotechnology Infrastructure, a member of the National Nanotechnology Coordinated Infrastructure, which is supported by the National Science Foundation (Grant ECCS-1542101). We acknowledge OregonBEST for their financial contributions supporting the XPS capabilities at OSU.”